This instrument is a scanning transmission electron microscope (S/TEM) equipped with a high brightness and high electron beam current (up to 50 nA) XFEG field emission gun and a symmetrically arranged quadrant XEDS detector system delivering high resolution and high throughput 2D/3D S/TEM imaging and chemical mapping. Owing to its high brightness electron gun configuration, Talos F200X provides better than 0.1 nm HRTEM line resolution and 0.16 nm STEM resolution. The system is also equipped with a direct electron detector for low-dose TEM experiments. Additionally, an integrated free scan module coupled with the direct electron detector allows for 4DSTEM acquisitions.