This instrument is a probe aberration corrected (S-CORR) S/TEM equipped with a cold field emission gun (X-CFEG). The combination of high brightness X-CFEG and 5th order aberration corrector S-CORR delivers ultimate sub-Angstrom STEM image resolution at the accelerating voltages of 60 kV to 200 kV. The Spectra 200 contains Thermo Scientific symmetric quadrant XEDS detector configuration, achieving fast conventional and atomic resolution chemical mapping as well as 3D XEDS tomography. The system is also equipped with a 16-segment Thermo Scientific Panther detector system enabling improved differential phase contrast (DPC) and integrated differential phase contrast (iDPC) imaging in STEM.